Application
Both the SMX-1000 Plus and SMX-1000L Plus provide high-magnification nondestructive fluoroscopic examinations of junction conditions (disconnect, contact) of ultra-micro parts on high-density PCBs, BGAs, CSPs, or system LSIs.
Features
Further Improved Operability
Remodeled windows and an enlarged display with a simple, user-friendly layout ensure the intended operation is performed without guesswork.
Clear Images
As with earlier models, the combination of flat panel detector with Shimadzu image processing technology leads to clear, distortion-free images
.
Inclined Fluoroscopy
The flat panel detector with a tilt angle of up to 60° enables fluoroscopy over an extensive range while maintaining constant magnification, so defects that are undetectable with vertical fluoroscopy can be detected.
Easy Measurements
Troublesome measurement parameter settings are automatically optimized, and thanks to our proprietary image-processing technology, measurement results are now obtained with simple mouse operations
.